Regress Pro 1.4.1
A scientific/industrial software that can be used to study experimental data
Regress Pro has been developed mainly for the application of thin film measurement in the semiconductor industry.
The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials.
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What's New in This Release:
- This release fixes several bugs and improve some small usability issues. This is a recommended upgrade for all the users of Regress Pro.