The SIFT feature detection algorithm has been invented and published by David Lowe at the University of British Columbia.
The algorithm provides the capability to identify key feature points within
arbitrary images. It further extracts highly distinct information for each such point and allows to characterize the point invariant to a number of modifications to the image. It is invariant to contrast/brightness changes, to rotation, scaling and partially invariant to other kinds of transformations. The algorithm can be flexibly used to create input data for image matching, object identification and other computer vision related algorithms.
The use of the SIFT algorithm for automatic panorama creation has been developed by Matthew Brown and David Lowe in their paper "Recognising Panoramas".
What's New in This Release:
· This release contains many bugfixes and speed improvements, plus support for feature identification in conformal space.